DocumentCode
1614670
Title
A 10b 500MHz 55mW CMOS ADC
Author
Verma, Ashutosh ; Razavi, Behzad
Author_Institution
Univ. of California, Los Angeles, CA, USA
fYear
2009
Firstpage
84
Abstract
Recent work on ADCs targeting sampling rates of hundreds of MHz with resolutions in the range of 10 to 11 b has faced speed limitations with a single channel or employed interleaving, but with a relatively high power dissipation or low SNDR. This paper introduces a calibration technique that, together with a high-speed opamp topology, allows a single channel to operate at 500 MHz and digitize a 233 MHz input with an SNDR of 53 dB. This SNDR yields a figure of merit (FOM) of 0.3 pJ/conversion-step, the lowest reported for 10 and 11 b ADCs running at these frequencies.
Keywords
CMOS integrated circuits; analogue-digital conversion; calibration; high-speed integrated circuits; operational amplifiers; CMOS ADC; SNDR; calibration technique; figure-of-merit; frequency 233 MHz; frequency 500 MHz; high-speed opamp topology; power 55 mW; word length 10 bit; CMOS technology; Calibration; Capacitors; Circuits; Energy consumption; Frequency; Least squares approximation; Linearity; Sampling methods; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International
Conference_Location
San Francisco, CA
Print_ISBN
978-1-4244-3458-9
Type
conf
DOI
10.1109/ISSCC.2009.4977319
Filename
4977319
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