• DocumentCode
    1614670
  • Title

    A 10b 500MHz 55mW CMOS ADC

  • Author

    Verma, Ashutosh ; Razavi, Behzad

  • Author_Institution
    Univ. of California, Los Angeles, CA, USA
  • fYear
    2009
  • Firstpage
    84
  • Abstract
    Recent work on ADCs targeting sampling rates of hundreds of MHz with resolutions in the range of 10 to 11 b has faced speed limitations with a single channel or employed interleaving, but with a relatively high power dissipation or low SNDR. This paper introduces a calibration technique that, together with a high-speed opamp topology, allows a single channel to operate at 500 MHz and digitize a 233 MHz input with an SNDR of 53 dB. This SNDR yields a figure of merit (FOM) of 0.3 pJ/conversion-step, the lowest reported for 10 and 11 b ADCs running at these frequencies.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; calibration; high-speed integrated circuits; operational amplifiers; CMOS ADC; SNDR; calibration technique; figure-of-merit; frequency 233 MHz; frequency 500 MHz; high-speed opamp topology; power 55 mW; word length 10 bit; CMOS technology; Calibration; Capacitors; Circuits; Energy consumption; Frequency; Least squares approximation; Linearity; Sampling methods; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4244-3458-9
  • Type

    conf

  • DOI
    10.1109/ISSCC.2009.4977319
  • Filename
    4977319