DocumentCode
1617651
Title
PD inception conditions and PD pattern of defects in PILC
Author
Muramoto, Yuji ; Gulski, Edward ; Wester, Frank J. ; Smit, Johan J.
Author_Institution
Dept. of Electr. & Electron. Eng., Toyohashi Univ. of Technol., Japan
fYear
2001
fDate
6/23/1905 12:00:00 AM
Firstpage
369
Lastpage
372
Abstract
A new medium voltage paper-insulated lead cable (PILC) network represents a large investment, and it is from the economic point of view essential to extend the life time of the medium voltage power cables as much as possible. It is known that with increasing age, the number of faults will increase and the power supply quality might deteriorate. Important symptoms of this degradation process can be related to discharging local insulation imperfections or defects which may occur in particular cable sections or cable accessories: joints and terminations. The PILC section may consist of species of different insulation types and multiple defects may occur at the same time. As a result complex partial discharge (PD) pictures may be measured representing the PD information of all these particular elements. In this study we look at the typical PILC insulation related PD induced dielectric failure processes from the physical point of view
Keywords
insulation testing; paper; partial discharge measurement; power cable insulation; power cable testing; PD inception conditions; PD induced dielectric failure processes; PD pattern; degradation process; insulation; insulation defects; local insulation imperfections; medium voltage PILC network; medium voltage power cables; multiple defects; paper-insulated lead cable network; Cable insulation; Degradation; Dielectric measurements; Dielectrics and electrical insulation; Investments; Medium voltage; Partial discharges; Power cables; Power generation economics; Power quality;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid Dielectrics, 2001. ICSD '01. Proceedings of the 2001 IEEE 7th International Conference on
Conference_Location
Eindhoven
Print_ISBN
0-7803-6352-3
Type
conf
DOI
10.1109/ICSD.2001.955659
Filename
955659
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