DocumentCode
1620042
Title
Auditing of a Class 0 facility
Author
Iben, Icko Eric Timothy ; Lam, Michelle ; Mohammadnejad, Milad ; Paniagua, Bill
Author_Institution
Almaden Res. Center, IBM Co., San Jose, CA, USA
fYear
2013
Firstpage
1
Lastpage
9
Abstract
Auditing a manufacturing facility which assembles devices with magnetoresistive readers requires finding and eliminating sources of both ESD and EOS pulses at levels below 1 V. A Discharge Event Audit tool was made to observe ESD and EOS pulses occur in tape head manufacturing line using MR readers.
Keywords
electrostatic discharge; magnetoresistive devices; production facilities; EOS pulses; ESD pulses; MR readers; auditing; class 0 facility; discharge event audit tool; magnetoresistive readers; manufacturing facility; tape head manufacturing line; Current measurement; Earth Observing System; Electrostatic discharges; Pulse measurements; Resistors; Voltage measurement; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location
Las Vegas, NV
ISSN
0739-5159
Type
conf
Filename
6635943
Link To Document