Calculating the effects of linear dependencies in m-sequences used as test stimuli

When pseudorandom patterns generated by a linear feedback shift register (LFSR) are used as test stimuli, there is always a concern about the linear dependencies within the sequence of patterns. It is possible for these linear dependencies to prevent a specific test pattern from being present in the sequence of applied patterns. These dependencies and ways to calculate their effects on a particular test are discussed. Using the analysis procedures outlined, it is possible to construct the sampling polynomial that describes the connection between a fault under test and the STUMPS structure. This sampling polynomial can then be analyzed to determine if the connection contains any linear dependencies. If a linear dependency is present in the connection, and if it prevents a required test from being presented to the fault under test, the connections between the fault under test and the STUMPS structure must be changed