DocumentCode
1621407
Title
Memory performance in chip-on-chip packages: Optimizing memory/ASIC integration
Author
O´Connor, Kevin J. ; Low, Yee L. ; Gregus, Jeffrey A. ; Degani, Yinon
Author_Institution
AT&T Bell Labs., Murray Hill, NJ, USA
fYear
1998
Firstpage
16
Lastpage
20
Abstract
Chip-on-chip MCM packaging combines the benefits of conventional MCM methods with conventional ASIC/commercial memory printed circuit board design methods. COC can reduce board space, increase performance, maintain a cost competitive position and offer an alternative to embedded SRAM and DRAM in the appropriate situations. We show that additional testing for known-good-die is minimal, functional to parametric memory yield is very high, COC module assembly is simple and straightforward, and final packaging is essentially identical to conventional ASIC packaging processes
Keywords
DRAM chips; EPROM; SRAM chips; application specific integrated circuits; circuit optimisation; integrated circuit design; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; microassembling; multichip modules; ASIC design methods; ASIC packaging processes; COC module assembly; EPROM; MCM methods; board space; chip-on-chip MCM packaging; chip-on-chip packages; cost competitiveness; embedded DRAM; embedded SRAM; functional-to-parametric memory yield; known-good-die testing; memory performance; memory printed circuit board design methods; memory/ASIC integration optimization; Application specific integrated circuits; Assembly; Bonding; Costs; EPROM; Packaging; Random access memory; Space technology; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
IC/Package Design Integration, 1998. Proceedings. 1998 IEEE Symposium on
Conference_Location
Santa Cruz, CA
Print_ISBN
0-8186-8433-X
Type
conf
DOI
10.1109/IPDI.1998.663614
Filename
663614
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