• DocumentCode
    1621407
  • Title

    Memory performance in chip-on-chip packages: Optimizing memory/ASIC integration

  • Author

    O´Connor, Kevin J. ; Low, Yee L. ; Gregus, Jeffrey A. ; Degani, Yinon

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • fYear
    1998
  • Firstpage
    16
  • Lastpage
    20
  • Abstract
    Chip-on-chip MCM packaging combines the benefits of conventional MCM methods with conventional ASIC/commercial memory printed circuit board design methods. COC can reduce board space, increase performance, maintain a cost competitive position and offer an alternative to embedded SRAM and DRAM in the appropriate situations. We show that additional testing for known-good-die is minimal, functional to parametric memory yield is very high, COC module assembly is simple and straightforward, and final packaging is essentially identical to conventional ASIC packaging processes
  • Keywords
    DRAM chips; EPROM; SRAM chips; application specific integrated circuits; circuit optimisation; integrated circuit design; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; microassembling; multichip modules; ASIC design methods; ASIC packaging processes; COC module assembly; EPROM; MCM methods; board space; chip-on-chip MCM packaging; chip-on-chip packages; cost competitiveness; embedded DRAM; embedded SRAM; functional-to-parametric memory yield; known-good-die testing; memory performance; memory printed circuit board design methods; memory/ASIC integration optimization; Application specific integrated circuits; Assembly; Bonding; Costs; EPROM; Packaging; Random access memory; Space technology; Testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IC/Package Design Integration, 1998. Proceedings. 1998 IEEE Symposium on
  • Conference_Location
    Santa Cruz, CA
  • Print_ISBN
    0-8186-8433-X
  • Type

    conf

  • DOI
    10.1109/IPDI.1998.663614
  • Filename
    663614