• DocumentCode
    1621731
  • Title

    Hardware-based weighted random pattern generation for boundary scan

  • Author

    Brglez, Franc ; Gloster, Clay ; Kedem, Gershon

  • Author_Institution
    Microelectron. Center of North Carolina, Research Triangle Park, NC, USA
  • fYear
    1989
  • Firstpage
    264
  • Lastpage
    274
  • Abstract
    The authors introduce WARP, a weighted test generation system that includes a canonical circuit for resolving weights to any desired precision. Either cellular automata registers (CARs) or linear feedback shift registers (LFSRs) are used as a source of random patterns, and optionally, it is possible to permute and linearly combine random bits from the source to control inputs to the weighting circuit. The authors analyze pattern coverage and conclude with benchmark results on fault coverage differences between CARs and LFSRs
  • Keywords
    automatic test equipment; finite automata; logic testing; random processes; shift registers; ATE; WARP; boundary scan; canonical circuit; cellular automata registers; fault coverage; linear feedback shift registers; logic testing; pattern coverage; weighted random pattern generation; Benchmark testing; Circuit faults; Circuit testing; Hardware; Legged locomotion; Linear feedback shift registers; Microelectronics; Performance evaluation; System testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
  • Conference_Location
    Washington, DC
  • Type

    conf

  • DOI
    10.1109/TEST.1989.82307
  • Filename
    82307