• DocumentCode
    1621751
  • Title

    The effect of noise in dynamic testing of A/D converters

  • Author

    Pei, Shiyan ; Khouzam, Nash

  • Author_Institution
    Nat. Semiconductor Corp., Santa Clara, CA, USA
  • fYear
    1992
  • Firstpage
    60
  • Abstract
    The concept of adding noise to the signal source to improve the accuracy and repeatability of the measurements of analog to digital (A/D) converters is introduced. The theoretical background and practical implementation issues are presented. The use of random noise to smooth the edges of quantization noise is discussed, and the relationship of total harmonic distortion to transfer junction is examined
  • Keywords
    analogue-digital conversion; dynamic testing; random noise; A/D converters; accuracy; dynamic testing; noise; quantization noise; random noise; repeatability; signal source; total harmonic distortion; transfer junction; Data acquisition; Distortion measurement; Harmonic distortion; Noise measurement; Noise shaping; Quantization; Semiconductor device noise; Signal to noise ratio; Testing; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-0510-8
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1992.271334
  • Filename
    271334
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1621751