• DocumentCode
    1622093
  • Title

    Symmetries of single-slice multiple-pinhole tomographs

  • Author

    Aarsvold, J.N. ; Barrett, H.H.

  • Author_Institution
    Dept. of Math., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    3
  • fYear
    1996
  • Firstpage
    1673
  • Abstract
    The singular-value decomposition (SVD) of an imaging system can be used to characterize the system. For example, because the SVD can be used to characterize the null space and range space of a system, it can be used to investigate the nature of the information a system measures and that which it does not measure. As this is the case, the SVDs of various tomographic systems have been specified and used to characterize some systems; however, specification of the SVDs of multiple-pinhole systems has not been done. We present results related to development of such a specification. A matrix operator that models a single-slice multiple-pinhole tomograph is generated via simulation, the SVD of the operator numerically obtained, and the symmetries of the system identified and correlated with symmetries of the singular vectors. Specifically, because the symmetries of the system are consistent with the structures of the dihedral group of order eight, the symmetries of the singular vectors are correlated with the irreducible representations of the dihedral group, D4
  • Keywords
    image reconstruction; medical image processing; single photon emission computed tomography; singular value decomposition; SVD; dihedral group; imaging system; irreducible representations; matrix operator; null space; range space; simulation; single-slice multiple-pinhole tomographs; singular vectors; singular-value decomposition; specification; symmetries; Computational modeling; Detectors; Displays; Extraterrestrial measurements; Geometry; Mathematics; Null space; Object detection; Optical imaging; Tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-3534-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1996.587949
  • Filename
    587949