An experiment for radial temperature profile measurements in a microwave induced plasma at atmospheric pressure

summary form only given. A microwave induced plasma device is being developed for sensitive continuous emission monitoring of trace metals in furnace exhausts using atomic emission spectroscopy. The plasma is created in air at atmospheric pressure, and maintained by a 1.5 kW, 2.45 GHz microwave source. A diagnostic system, consisting of a fiber optic cable, lenses, a spectrometer, and a linear Si diode detector array, provides information about the light emitted from the plasma with a maximum resolution of 0.01 nm in the range of 190-600 nm. In this work we describe the experimental setup for the temperature profile reconstruction, the conceptual method for data analysis and some preliminary results.