DocumentCode
1625358
Title
An approach to functional level testability analysis
Author
Chen, C.H. ; Menon, P.R.
Author_Institution
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
fYear
1989
Firstpage
373
Lastpage
380
Abstract
The authors present an approach to testability analysis applicable to circuits containing functional modules described behaviorally. They consider two types of modules-combinational modules described by binary decision diagrams and sequential modules defined by state tables. Controllability and observability measures for such modules are defined, and algorithms are developed for computing them. The method has been applied to a few small modules and circuits, and appears to be feasible. The combinational measures, applicable to both combinational and sequential modules, indicate the probability of setting a lead to a particular value or observing the effect of a signal change at an output. The sequential measures, also applicable to both types of modules, give estimates of sequence lengths needed for controlling and observing any lead in the circuit. These two measures together give an indication of not only the difficulty in deriving tests for a circuit but also the length of test sequences that may be needed
Keywords
combinatorial circuits; controllability; logic testing; modules; observability; probability; sequential circuits; algorithms; binary decision diagrams; combinational modules; controllability; functional level testability analysis; functional modules; observability; probability; sequence lengths; sequential modules; state tables; Boolean functions; Circuit analysis computing; Circuit testing; Circuits and systems; Controllability; Data structures; Logic circuits; Observability; Process design; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location
Washington, DC
Type
conf
DOI
10.1109/TEST.1989.82321
Filename
82321
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