• DocumentCode
    1625479
  • Title

    Electron density measurement for microwave-induced atmospheric pressure plasmas using laser deflection method

  • Author

    Lee, Seung Hun ; Kim, Junghee ; Moon, S.Y. ; Choe, W. ; Baang, S.

  • Author_Institution
    KAIST, Daejeon
  • fYear
    2007
  • Firstpage
    626
  • Lastpage
    626
  • Abstract
    Summary form only given. A laser beam passing through plasma deflects due to a change in the line-integrated refractive index, which is attributed to an electron density gradient along the chord. By measuring the deflection angle of the laser beam, the electron density was obtained for an atmospheric pressure microwave-induced torch plasma generated in the ambient air. The diagnostic set-up, consisting of a low power He-Ne laser, a four channel segmented position-sensitive photodiode detector, and some relevant optical components, demands modest requirements of laser quality and optics alignments. The measured electron density was compared with that obtained by optical emission spectroscopy based on the measured Stark broadening width of the Balmer H-beta line emitted from the plasma. Both the multi channel deflection method and the optical emission method showed the same order of magnitude (~1015 cm-3) electron density values. Comparison of the detailed results will be presented.
  • Keywords
    plasma density; plasma diagnostics; plasma light propagation; plasma torches; Balmer H-beta line; Stark broadening width; deflection angle; electron density gradient; laser deflection method; line-integrated refractive index; microwave-induced atmospheric pressure plasmas; multichannel deflection method; optical emission spectroscopy; plasma torch; position-sensitive photodiode detector; Atmospheric-pressure plasmas; Density measurement; Electron beams; Electron optics; Laser modes; Masers; Microwave theory and techniques; Plasma density; Plasma measurements; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
  • Conference_Location
    Albuquerque, NM
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-0915-0
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4345932
  • Filename
    4345932