• DocumentCode
    1625634
  • Title

    A new plasma source for photoresist ash and residue removal

  • Author

    SRIVASTAVA, ANURAG K. ; Pingree, R. ; Ferris, David

  • Author_Institution
    Eaton Corp., Rockville, MD, USA
  • fYear
    1998
  • Firstpage
    181
  • Abstract
    Summary form only given. A new microwave driven (2.45 GHz) plasma source has been developed at Fusion Systems Division of the Eaten Corporation´s Semiconductor Equipment Operation, to be used as a downstream asher. It operates by exciting the TM/sub 012/ resonant microwave mode in a cylindrical cavity structure. The source consists of an internally tuned microwave cavity that dynamically adjusts the cavity dimensions to match all changes in the plasma impedance. This is accomplished by a sliding short, and adjustable antenna lengths. Internal tuning ensures maximum power input to the plasma for all operating conditions by minimizing reflected power to less than 1% over a large operating window. Due to its novel internal tuning mechanism, there is no need for any external matching network, and therefore negligible power is lost to this internal matching unit. The plasma is totally contained in a dielectric tube running through the length of the cylindrical microwave cavity and is transported downstream for ashing.
  • Keywords
    lithography; photoresists; plasma applications; plasma production; surface chemistry; surface cleaning; TM/sub 012/ resonant microwave mode; adjustable antenna lengths; cylindrical microwave cavity structure; dielectric tube; downstream asher; external matching network; internal tuning; internal tuning mechanism; internally tuned microwave cavity; microwave driven plasma source; operating conditions; operating window; photoresist ash removal; photoresist residue removal; power input; reflected power; sliding short; Ash; Atomic measurements; Microwave devices; Plasma applications; Plasma sources; Plasma transport processes; Radio frequency; Resists; Resonance; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
  • Conference_Location
    Raleigh, NC, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-4792-7
  • Type

    conf

  • DOI
    10.1109/PLASMA.1998.677650
  • Filename
    677650