DocumentCode
1625634
Title
A new plasma source for photoresist ash and residue removal
Author
SRIVASTAVA, ANURAG K. ; Pingree, R. ; Ferris, David
Author_Institution
Eaton Corp., Rockville, MD, USA
fYear
1998
Firstpage
181
Abstract
Summary form only given. A new microwave driven (2.45 GHz) plasma source has been developed at Fusion Systems Division of the Eaten Corporation´s Semiconductor Equipment Operation, to be used as a downstream asher. It operates by exciting the TM/sub 012/ resonant microwave mode in a cylindrical cavity structure. The source consists of an internally tuned microwave cavity that dynamically adjusts the cavity dimensions to match all changes in the plasma impedance. This is accomplished by a sliding short, and adjustable antenna lengths. Internal tuning ensures maximum power input to the plasma for all operating conditions by minimizing reflected power to less than 1% over a large operating window. Due to its novel internal tuning mechanism, there is no need for any external matching network, and therefore negligible power is lost to this internal matching unit. The plasma is totally contained in a dielectric tube running through the length of the cylindrical microwave cavity and is transported downstream for ashing.
Keywords
lithography; photoresists; plasma applications; plasma production; surface chemistry; surface cleaning; TM/sub 012/ resonant microwave mode; adjustable antenna lengths; cylindrical microwave cavity structure; dielectric tube; downstream asher; external matching network; internal tuning; internal tuning mechanism; internally tuned microwave cavity; microwave driven plasma source; operating conditions; operating window; photoresist ash removal; photoresist residue removal; power input; reflected power; sliding short; Ash; Atomic measurements; Microwave devices; Plasma applications; Plasma sources; Plasma transport processes; Radio frequency; Resists; Resonance; Tuning;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
Conference_Location
Raleigh, NC, USA
ISSN
0730-9244
Print_ISBN
0-7803-4792-7
Type
conf
DOI
10.1109/PLASMA.1998.677650
Filename
677650
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