Multisine excitation for ACPR measurements

Author

Remley, K.A.

Author_Institution

RF Technol. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA

Volume

3

fYear

2003

Firstpage

2141

Abstract

We use a simulator to compare adjacent-channel power ratio (ACPR) measurements of a nonlinear device excited with various multisine signals to ACPR measurements of the same device excited with pseudorandom digital modulation. We examine four common types of multisine excitation, each with identical numbers of tones, tone-spacings, and nominal power levels, but with different magnitude and phase relationships between tones. We show that use of some common multisines may result in significant overestimation of the actual ACPR from the digitally modulated nonlinear device.

Keywords

adjacent channel interference; modulation; time-domain analysis; ACPR measurements; adjacent-channel power ratio; magnitude relationships; multisine signals; nominal power levels; nonlinear device; overestimation; phase relationships; pseudorandom digital modulation; tone-spacings; Character generation; Digital modulation; Multiaccess communication; NIST; Peak to average power ratio; Power measurement; Quadrature phase shift keying; RF signals; Radio frequency; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2003 IEEE MTT-S International

Conference_Location

Philadelphia, PA, USA

ISSN

0149-645X

Print_ISBN

0-7803-7695-1

Type

conf

DOI

10.1109/MWSYM.2003.1210586

Filename

1210586