• DocumentCode
    1628540
  • Title

    Device characteristics of single-layer graphene FETs grown on copper

  • Author

    Tahy, Kristof ; Fleming, Margaret Jane ; Raynal, Barbara ; Protasenko, Vladimir ; Koswatta, Siyuranga ; Jena, Debdeep ; Xing, Huili ; Kelly, Michelle

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
  • fYear
    2010
  • Firstpage
    77
  • Lastpage
    78
  • Abstract
    The exceptional electrical properties of graphene materials have led to an explosion of research investigating the potential of graphene as the foundation for a future generation of devices as well as developing methods of producing high quality graphene materials. Material quality and our ability to manipulate the properties of graphene will ultimately determine the success of graphene as a device platform. Recently, the formation of single layer graphene via catalyzed-chemical vapor deposition (CVD) on copper foils has generated much interest. A few groups have reported the CVD growth of graphene on copper, and transport properties including quantum Hall effect in layers subsequently transferred to insulating substrates. However, there have been no careful studies of FETs fabricated from them. In this work, we report the characteristics of single-layer graphene FETs whose channels were grown by CVD on copper.
  • Keywords
    catalysis; chemical vapour deposition; copper; field effect transistors; graphene; quantum Hall effect; semiconductor materials; CVD growth; Cu; catalyzed-chemical vapor deposition; device characteristics; electrical property; graphene material; insulating substrate; material quality; quantum Hall effect; single-layer graphene FET; Copper; FETs; Impurities; Modulation; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2010
  • Conference_Location
    South Bend, IN
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4244-6562-0
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2010.5551930
  • Filename
    5551930