• DocumentCode
    1631148
  • Title

    RF front-end system gain and linearity built-in test

  • Author

    Wang, Qi ; Soma, Mani

  • Author_Institution
    Dept. of Electr. Eng., Washington Univ., Seattle, WA
  • fYear
    2006
  • Lastpage
    233
  • Abstract
    This work addresses the concurrent on-chip measurement of the gain, the input 1-dB compression point (ICP1-dB), and the input-referred third-order interference point (IIP3) of individual RF building blocks in RF front-end systems, using introduced high speed CMOS RF on-chip amplitude detectors, which work up to 20 GHz with high accuracy, small area, and low power consumption
  • Keywords
    CMOS integrated circuits; built-in self test; gain measurement; high-speed integrated circuits; CMOS amplitude detectors; RF amplitude detectors; RF building blocks; RF front-end system; built-in test; concurrent on-chip measurement; gain measurement; high speed amplitude detectors; input-referred interference point; linearity measurement; on-chip amplitude detectors; third-order interference point; Area measurement; Built-in self-test; Detectors; Gain measurement; Linearity; Power measurement; Radio frequency; Radiofrequency interference; System-on-a-chip; Velocity measurement; CMOS RF amplitude; RF test; built-in test; detector; gfain measurement; linearity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2006. Proceedings. 24th IEEE
  • Conference_Location
    Berkeley, CA
  • Print_ISBN
    0-7695-2514-8
  • Type

    conf

  • DOI
    10.1109/VTS.2006.59
  • Filename
    1617594
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1631148