Breakdown of dielectric/vacuum interfaces caused by high power microwaves

Summary form only given. Physical mechanisms leading to microwave breakdown on dielectric/vacuum interfaces are investigated for power levels on the order of 100 MW at 2.85 GHz. A 3 MW magnetron with 3.5 /spl mu/s pulse width, is coupled to an S-band traveling wave resonator which is kept at a pressure of 10/sup -8/ Torr. The investigation is focused on an interface geometry comprising a thin dielectric polymer slab in the waveguide, oriented vertical to the direction of wave propagation, and two field enhancement tips placed in the middle of each waveguide broad wall. This ensures an almost purely tangential field at the interface surface and a localized breakdown.