• DocumentCode
    1632812
  • Title

    Pulsed, high energy testing of resistors

  • Author

    Shkuratov, S.I. ; Kristiansen, M. ; Dickens, J. ; Hatfield, L.L. ; Horrocks, E.

  • Author_Institution
    Dept. of Electr. Eng. & Phys., Texas Tech. Univ., Lubbock, TX, USA
  • Volume
    2
  • fYear
    1999
  • Firstpage
    712
  • Abstract
    Three types of resistors have been tested to determine maximum usable power at pulsed high voltage and pulsed high current. Experiments were carried out using high voltage cable generators and spark-gap generators. Pulse durations were varied from 0.7 /spl mu/s to 21 /spl mu/s. The pulse amplitudes were varied from 1 kV to 12 kV. The peak current reached was 3 kA. Metal film, carbon film and carbon composition resistors of four different rated powers (0.25 W, 0.5 W, 1 W, 2 W) have been tested. Data are given for the limiting pulsed energy for each type of resistor in nanosecond and microsecond time ranges. The mechanisms of failure and destruction of resistors under the action of high voltage and high current pulses are discussed.
  • Keywords
    failure analysis; high-voltage techniques; impulse testing; pulse generators; pulsed power supplies; resistors; spark gaps; 0.25 to 2 W; 0.7 to 21 mus; 1 to 12 kV; 3 kA; carbon composition resistors; carbon film; high current pulses; high voltage cable generators; high voltage pulses; limiting pulsed energy; maximum usable power; metal film; microsecond time range; nanosecond time range; peak current; pulse amplitudes; pulsed high energy testing; resistor destruction; resistor failure mechanisms; resistors; spark-gap generators; Electrical resistance measurement; Laboratories; Probes; Pulse generation; Pulse measurements; Pulse transformers; Resistors; Spark gaps; System testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    0-7803-5498-2
  • Type

    conf

  • DOI
    10.1109/PPC.1999.823612
  • Filename
    823612