• DocumentCode
    1632929
  • Title

    Thickness-shear vibration of crystal plates under time-dependent biasing deformations

  • Author

    Kosinski, John A. ; Pastore, Robert A., Jr. ; Yang, Jiashi ; Zhang, Xuesong

  • Author_Institution
    US Army CECOM, Fort Monmouth, NJ, USA
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    597
  • Lastpage
    604
  • Abstract
    Incremental vibration of a crystal plate under time-harmonic biasing deformations is studied using the equations for small fields superposed on finite biasing fields. It is shown that the incremental thickness-shear vibration of certain crystal plates, including Y-cut quartz and langasite plates, is governed by an equation with time dependent coefficients. The equation is reduced to the well known Mathieu equation. Approximate analytical solutions are obtained. In particular, the case when the frequency of the biasing deformations is much lower than the frequency of the incremental thickness-shear vibration is examined in detail. The thickness-shear vibration is shown to be both frequency and amplitude modulated; with the frequency modulation as a first-order effect and the amplitude modulation a second-order effect. The results are of fundamental importance to the study of the vibration sensitivity of crystal resonators
  • Keywords
    crystal resonators; deformation; vibrations; Mathieu equation; Y-cut quartz plates; amplitude modulation; boundary conditions; crystal plate; crystal resonators; electroelastic body; finite biasing fields; first-order effect; frequency modulation; incremental vibration; langasite plates; second-order effect; small fields; thickness-shear vibration; time dependent coefficients; time-harmonic biasing deformations; vibration sensitivity; Acceleration; Amplitude modulation; Equations; Frequency modulation; Missiles; Power harmonic filters; Production; Resonance; Resonant frequency; Satellite navigation systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and PDA Exhibition, 2001. Proceedings of the 2001 IEEE International
  • Conference_Location
    Seattle, WA
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-7028-7
  • Type

    conf

  • DOI
    10.1109/FREQ.2001.956346
  • Filename
    956346