DocumentCode
1633111
Title
Intellectual recognition of reliability analysis model based on neural network integration
Author
Li, Li ; Gao, Zhi
Author_Institution
Tangshan Coll., Tangshan, China
Volume
2
fYear
2012
Firstpage
450
Lastpage
453
Abstract
Intellectual recognition method for the reliability distribution models based on neural network integration has been studied. Normal distribution, Weibull distribution and logarithmic normal distribution are tested and analyzed. The simulation test results tell us that the intellectual recognition system has high confidence degree and high recognition rate, and is easy to be implemented in engineering.
Keywords
Weibull distribution; machinery; mechanical engineering computing; neural nets; reliability; Weibull distribution; intellectual recognition; logarithmic normal distribution; machinery design; machinery reliability analysis; neural network integration; reliability analysis; Analytical models; Bagging; Boosting; Gaussian distribution; Neural networks; Reliability; Training; Neural Network Integration; fault distribution; mechanical product; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation & Measurement, Sensor Network and Automation (IMSNA), 2012 International Symposium on
Conference_Location
Sanya
Print_ISBN
978-1-4673-2465-6
Type
conf
DOI
10.1109/MSNA.2012.6324618
Filename
6324618
Link To Document