Efficient generation of test patterns using Boolean difference

Author

Larrabee, Tracy

Author_Institution

Dept. of Comput. Sci., Stanford Univ., CA, USA

fYear

1989

Firstpage

795

Lastpage

801

Abstract

Most automatic test pattern generation systems for combinational circuits generate a test for a given fault by directly searching a data structure representing the circuit to be tested. The author describes a novel system that divides the problem into two parts: first it constructs a formula expressing the Boolean difference between the unfaulted and faulted circuits. Second, it applies a Boolean satisfiability algorithm to the resulting formula. The novel system can incorporate any of the heuristics used by structural search techniques. It is not only quite general but is able to test or improve untestable every fault in the popular Brglez-Fujiwara test benchmark (Int. Symp. Circuits and Systems, June 1985). Experimental results are presented

Keywords

Boolean functions; automatic testing; combinatorial circuits; data structures; fault location; logic testing; Boolean difference; Brglez-Fujiwara test benchmark; automatic test pattern generation; automatic testing; combinational circuits; data structure; faulted circuits; heuristics; structural search techniques; Automatic test pattern generation; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Circuits and systems; Combinational circuits; Data structures; System testing; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1989. Proceedings. Meeting the Tests of Time., International

Conference_Location

Washington, DC

Type

conf

DOI

10.1109/TEST.1989.82368

Filename

82368