• DocumentCode
    1634694
  • Title

    Evolved fault tolerance in evolvable hardware

  • Author

    Canham, R.O. ; Tyrrell, A.M.

  • Author_Institution
    Dept. of Electron., York Univ., UK
  • Volume
    2
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    1267
  • Lastpage
    1271
  • Abstract
    This paper considers the ability of an evolved circuit to acquire fault tolerance by including fault conditions within the fitness measure of the evolutionary process. A simple oscillator circuit, implemented on a Xilinx FPGA, showed a 12 fold increase in fault-tolerance when compared to a control oscillator using realistic faults
  • Keywords
    fault tolerance; field programmable gate arrays; Xilinx FPGA; evolved circuit; fault tolerance; oscillator circuit; redundancy; Circuit faults; Circuit testing; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Hardware; Oscillators; Redundancy; Robots; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Evolutionary Computation, 2002. CEC '02. Proceedings of the 2002 Congress on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-7282-4
  • Type

    conf

  • DOI
    10.1109/CEC.2002.1004425
  • Filename
    1004425
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1634694