• DocumentCode
    1636480
  • Title

    Performance of generalized selection combining over Weibull fading channels

  • Author

    Alouini, Mohamed-Slim ; Simon, Marvin K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
  • Volume
    3
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    1735
  • Abstract
    The literature is relatively sparse in performance analyses of diversity combining schemes over Weibull fading channels, despite the fact that the Weibull distribution is often found to be a suitable fit to empirical fading channel measurements. We capitalize on some interesting results due to Lieblein on the order statistics of Weibull random variables, to derive exact closed-form expressions for the combined average signal-to-noise ratio (SNR) as well as amount of fading (AF) at a generalized selection combining (GSC) output over Weibull fading channels. We also use some simple AF-based mappings between the fading parameters of the Weibull distribution and those of the Nakagami, Rice, and Hoyt distributions to obtain the approximate but accurate average SNR and AF of GSC over these type of channels. The mathematical equations are validated and illustrated by some numerical examples for scenarios of practical interest
  • Keywords
    Rician channels; Weibull distribution; mobile radio; spread spectrum communication; GSC output; Hoyt distribution; Nakagami distribution; Rice distribution; Weibull distribution; Weibull fading channels; Weibull random variables; average SNR; diversity combining schemes; generalized selection combining; next-generation wireless communication; order statistics; performance analyses; signal-to-noise ratio; spread-spectrum communication; Closed-form solution; Diversity reception; Equations; Nakagami distribution; Performance analysis; Random variables; Signal to noise ratio; Statistical distributions; Weibull distribution; Weibull fading channels;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference, 2001. VTC 2001 Fall. IEEE VTS 54th
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1090-3038
  • Print_ISBN
    0-7803-7005-8
  • Type

    conf

  • DOI
    10.1109/VTC.2001.956497
  • Filename
    956497