• DocumentCode
    163657
  • Title

    On the way to heterogeneous nanoelectronics, towards the zero power and zero variability world

  • Author

    Deleonibus, Simon

  • Author_Institution
    LETI, CEA, Grenoble, France
  • fYear
    2014
  • fDate
    12-14 May 2014
  • Firstpage
    7
  • Lastpage
    12
  • Abstract
    Nanoelectronics will have to face major challenges in the next decades in order to proceed with increasing progress to the sub 10 nm nodes: approach zero variability, reduce leakage currents and access resistances at the same time, fully exploit 3D integration at the device, elementary function, chip and system levels. New progress laws combined to the scaling down of CMOS based technology will emerge to enable new paths to Functional Diversification. New materials and disruptive architectures, mixing logic and memories, Heterogeneous Integration, introducing 3D schemes at the Front End and Back End levels, will come into play to make it possible.
  • Keywords
    CMOS integrated circuits; leakage currents; nanoelectronics; CMOS; access resistances; elementary function; functional diversification; leakage currents; logic; memories; nanoelectronics; size 10 nm; CMOS integrated circuits; Logic gates; Nanowires; Silicon; Three-dimensional displays; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
  • Conference_Location
    Belgrade
  • Print_ISBN
    978-1-4799-5295-3
  • Type

    conf

  • DOI
    10.1109/MIEL.2014.6842077
  • Filename
    6842077