DocumentCode
1637981
Title
A logic analyzer tool that cuts e-beam prober acquisition times
Author
Talbot, Christopher G. ; Rajan, Suresh
Author_Institution
Schlumberger Technol. ATE, San Jose, CA, USA
fYear
1989
Firstpage
923
Lastpage
927
Abstract
The authors describe a novel tool that dramatically extends the usability of electron-beam probers for long duty cycle applications. The tool is modeled on a conventional logic analyzer (primarily for ease-of-use reasons). The tool comprises both hardware and software, and utilizes new sampling strategies which exploit fully the available detector bandwidth, thereby reducing dramatically typical signal acquisition times. The tool also provides, under certain circumstances, the ability to acquire intermittent signals. The proposed approach improves typical signal acquisition times by two orders of magnitude
Keywords
VLSI; automatic test equipment; automatic testing; data acquisition; electron beam applications; integrated circuit testing; logic analysers; logic testing; ATE; IC testing; VLSI; e-beam prober; electron-beam probers; intermittent signals; logic analyzer tool; sampling; signal acquisition times; Bandwidth; Data acquisition; Detectors; Electron beams; Logic devices; Probes; Sampling methods; Scanning electron microscopy; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location
Washington, DC
Type
conf
DOI
10.1109/TEST.1989.82384
Filename
82384
Link To Document