• DocumentCode
    1637981
  • Title

    A logic analyzer tool that cuts e-beam prober acquisition times

  • Author

    Talbot, Christopher G. ; Rajan, Suresh

  • Author_Institution
    Schlumberger Technol. ATE, San Jose, CA, USA
  • fYear
    1989
  • Firstpage
    923
  • Lastpage
    927
  • Abstract
    The authors describe a novel tool that dramatically extends the usability of electron-beam probers for long duty cycle applications. The tool is modeled on a conventional logic analyzer (primarily for ease-of-use reasons). The tool comprises both hardware and software, and utilizes new sampling strategies which exploit fully the available detector bandwidth, thereby reducing dramatically typical signal acquisition times. The tool also provides, under certain circumstances, the ability to acquire intermittent signals. The proposed approach improves typical signal acquisition times by two orders of magnitude
  • Keywords
    VLSI; automatic test equipment; automatic testing; data acquisition; electron beam applications; integrated circuit testing; logic analysers; logic testing; ATE; IC testing; VLSI; e-beam prober; electron-beam probers; intermittent signals; logic analyzer tool; sampling; signal acquisition times; Bandwidth; Data acquisition; Detectors; Electron beams; Logic devices; Probes; Sampling methods; Scanning electron microscopy; Testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
  • Conference_Location
    Washington, DC
  • Type

    conf

  • DOI
    10.1109/TEST.1989.82384
  • Filename
    82384