DocumentCode
1639327
Title
Study and design on high reliability mass capacity memory
Author
Jianzhong, Tian ; Qinglin, Qiu ; Feng, Ba ; Jinye, Rong ; Yongxiang, Zhang
Author_Institution
Inf. Eng. Coll., Capital Normal Univ., Beijing, China
fYear
2010
Firstpage
701
Lastpage
704
Abstract
With the characters of deep storage destiny and high storage speed, the mass capacity memory based on NAND FLASH is widely used in space storage fields. However, due to a variety of condition constrain and bad blocks can be produced, so the reliability of mass capacity storage can not be assured especially in severe environment. A new design plan is proposed to realize the high reliability mass capacity memory. The core technology are triplication redundancy reading and writing of key data through SRAM, warm standby of FLASH arrays, checking of data playback and reasonable bad block management.
Keywords
SRAM chips; flash memories; storage management; Flash arrays; NAND Flash; SRAM; bad block management; data playback checking; mass capacity memory; space storage fields; static random access memory; Flash memory; Memory management; Radiation detectors; Random access memory; Redundancy; Watches; high reliability; mass capacity; memory; redundancy and fault-tolerance;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering and Service Sciences (ICSESS), 2010 IEEE International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-6054-0
Type
conf
DOI
10.1109/ICSESS.2010.5552455
Filename
5552455
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