• DocumentCode
    1639327
  • Title

    Study and design on high reliability mass capacity memory

  • Author

    Jianzhong, Tian ; Qinglin, Qiu ; Feng, Ba ; Jinye, Rong ; Yongxiang, Zhang

  • Author_Institution
    Inf. Eng. Coll., Capital Normal Univ., Beijing, China
  • fYear
    2010
  • Firstpage
    701
  • Lastpage
    704
  • Abstract
    With the characters of deep storage destiny and high storage speed, the mass capacity memory based on NAND FLASH is widely used in space storage fields. However, due to a variety of condition constrain and bad blocks can be produced, so the reliability of mass capacity storage can not be assured especially in severe environment. A new design plan is proposed to realize the high reliability mass capacity memory. The core technology are triplication redundancy reading and writing of key data through SRAM, warm standby of FLASH arrays, checking of data playback and reasonable bad block management.
  • Keywords
    SRAM chips; flash memories; storage management; Flash arrays; NAND Flash; SRAM; bad block management; data playback checking; mass capacity memory; space storage fields; static random access memory; Flash memory; Memory management; Radiation detectors; Random access memory; Redundancy; Watches; high reliability; mass capacity; memory; redundancy and fault-tolerance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering and Service Sciences (ICSESS), 2010 IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-6054-0
  • Type

    conf

  • DOI
    10.1109/ICSESS.2010.5552455
  • Filename
    5552455