• DocumentCode
    1640807
  • Title

    Signature analysis with non-linear feedback shift registers

  • Author

    Marinos, Peter N. ; Raina, Rajesh

  • Author_Institution
    Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
  • fYear
    1989
  • Firstpage
    954
  • Lastpage
    955
  • Abstract
    The use of nonlinear feedback shift registers (NLFSRs) in the design of signature analyzers (SAs) was investigated. It is shown that SAs with arbitrarily low values of error-escape probability and requiring less hardware than their linear feedback shift register (LFSR) counterparts are feasible and systematically realizable
  • Keywords
    feedback; logic analysers; logic design; probability; shift registers; data compression; error-escape probability; logic design; nonlinear feedback shift registers; signature analyzers; Circuit faults; Circuit testing; Hardware; Libraries; Linear feedback shift registers; Process design; Shift registers; Synthetic aperture sonar; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
  • Conference_Location
    Washington, DC
  • Type

    conf

  • DOI
    10.1109/TEST.1989.82405
  • Filename
    82405
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1640807