DocumentCode
1641262
Title
2005 Symposium on VLSI Technology (IEEE Cat. No. 05CH37642)
fYear
2004
Abstract
Presents the front cover, front matter, and table of contents from the conference proceedings.
Keywords
CMOS integrated circuits; DRAM chips; MOSFET; VLSI; dielectric thin films; flash memories; integrated circuit reliability; integrated circuit technology; DRAM; Ge channel transistor; VLSI; [110] channel transistor; advanced CMOS technology; advanced memories; analog-RF devices; flash memory; gate dielectric reliability; high k dielectric technology; metal gate technology; multigate Fin FET technology; process technology; strain enhanced CMOS;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on
Conference_Location
Honolulu, HI, USA
Print_ISBN
0-7803-8287-0
Type
conf
DOI
10.1109/VLSIC.2004.1346654
Filename
1346654
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