DocumentCode
1643277
Title
Research on ESD interference effect on interface circuit of microcomputer
Author
Yuan, Qing-yun ; Zhan-cheng Wu ; Song, Wen-wu
Author_Institution
Electrostatic & Electromagn. Protection Res. Inst., Shijiazhuang Mech. Eng., China
Volume
2
fYear
2005
Firstpage
936
Abstract
In this paper, a typical single-chip circuit is designed to simulate serial communication interface in order to study the effect of ESD EMP. Using the ESD generator, the radiation effect experiments of ESD on the single chip microprocessor (SCM) system have been carried out. By analyzing the experiment data, some rules of the typical serial communication circuit under ESD are presented.
Keywords
electromagnetic interference; electromagnetic pulse; electrostatic discharge; microcomputers; microprocessor chips; peripheral interfaces; EMP; ESD interference effect; SCM system; electromagnetic pulse; electrostatic discharge; microcomputer; serial communication interface circuit; single chip microprocessor; Cable shielding; Circuit simulation; Communication cables; Displays; Electromagnetic interference; Electrostatic discharge; Electrostatic interference; Microcomputers; Protection; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2005. MAPE 2005. IEEE International Symposium on
Print_ISBN
0-7803-9128-4
Type
conf
DOI
10.1109/MAPE.2005.1618074
Filename
1618074
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