• DocumentCode
    1646056
  • Title

    Improving Sn-0.3Ag-0.7Cu low-Ag lead-free solder performance by adding Bi element

  • Author

    Liu Yang ; Sun Fenglian ; Liu Xiaojing

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Harbin Univ. Sci. Tech, Harbin, China
  • fYear
    2010
  • Firstpage
    343
  • Lastpage
    346
  • Abstract
    Bi element addition effects on Sn-0.3Ag-0.7Cu low-Ag solder properties are studied in this work. Solder alloy with different Bi adding amount, Sn-0.3Ag-0.7Cu-XBi (X = 0, 1.0, 3.0, 4.5), were fabricated. The melting point, wettability, and strength tests were carried out to find the effects of Bi addition on current low-Ag solder. Thermal aging of the solder interconnects with different Bi addition was conducted. The intermetallic compound growth and shear strength were used to evaluate the Bi effects on thermal aging resistance. Test results of the newly fabricated solder were compared with that of original Sn-0.3Ag-0.7Cu. Results show that Bi addition has striking positive effects on improving wettability and decreasing melting point. With proper adding amount as X = 3.0, Bi element significantly improve both the wettability and melting point performance simultaneously. However, too much Bi addition could increase the melting range between liquidus and solidus, which may lead to the initiation of solidification crack inside the solder. The mechanical test also verified the embrittlement of the solder with too much Bi addition. The intermetallic compound growth at the interface of solder and copper during thermal aging was slow down with Bi addition. The shear test results after thermal aging also shows that Bi addition prevent the severe degradation of solder mechanical properties.
  • Keywords
    ageing; bismuth alloys; copper alloys; mechanical testing; melting; silver alloys; solders; tin alloys; wetting; Sn-Ag-Cu-Bi; intermetallic compound growth; lead free solder; mechanical test; melting point test; newly fabricated solder; shear strength; solder alloy; solder interconnects; strength test; thermal aging; wettability test; Aging; Bismuth; Copper; Integrated circuits; Lead;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Strategic Technology (IFOST), 2010 International Forum on
  • Conference_Location
    Ulsan
  • Print_ISBN
    978-1-4244-9038-7
  • Electronic_ISBN
    978-1-4244-9036-3
  • Type

    conf

  • DOI
    10.1109/IFOST.2010.5667986
  • Filename
    5667986