DocumentCode
1647321
Title
Improvement of thermal properties in epitaxial aluminum nitride pedestal microring
Author
Xianwen Liu ; Changzheng Sun ; Bing Xiong ; Zhibiao Hao ; Yanjun Han ; Jian Wang ; Lai Wang ; Yi Luo
Author_Institution
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
fYear
2015
Firstpage
1
Lastpage
3
Abstract
We report thermal properties improvement of aluminum nitride (AlN) microring resonator by adopting epitaxial material and pedestal structure. With optimized inductively coupled plasma (ICP) dry etching using Cl2/BCl3/Ar mixture, pedestal microring resonators have been fabricated on epitaxial AlN. Transmission measurement reveals a loaded quality factor of ~1×104 at under-coupled condition, corresponding to a propagation loss of 27 dB/cm around 1.55 μm. Thermal effect induced resonant peak shift at different coupled powers is 6.3 pm/mW, and optical bistability can be observed at an input power above ~115 mW.
Keywords
Q-factor; aluminium compounds; argon; boron compounds; chlorine; epitaxial growth; microcavities; microcavity lasers; optical bistability; optical losses; thermal analysis; AlN-Cl2-BCl3-Ar; epitaxial layer; epitaxial material; inductively coupled plasma; loaded quality factor; optical bistability; optimized ICP dry etching; pedestal microring resonator; pedestal structure; propagation loss; resonant peak shift; thermal effect; thermal properties improvement; transmission measurement; Aluminum nitride; Epitaxial growth; III-V semiconductor materials; Integrated optics; Nonlinear optics; Optical bistability; Optical resonators; Epitaxial AlN; ICP dry etching; pedestal microring; thermal properties;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Communications and Networks (ICOCN), 2015 14th International Conference on
Conference_Location
Nanjing
Type
conf
DOI
10.1109/ICOCN.2015.7203683
Filename
7203683
Link To Document