Electron energy loss spectrum analysis of polyethylene insulation

Author

Okamoto, Tatsuki ; Kanegami, Masaki ; Hozumi, Naohiro

Author_Institution

Central Res. Inst. of Electr. Power Ind., Tokyo, Japan

Volume

1

fYear

1997

Firstpage

459

Abstract

This paper describes EELS (electron energy loss spectroscopy) analysis of polyethylene to evaluate the mean free path of high energy electrons using an FE-STEM equipped with an electron energy loss spectrometer. Polyethylene specimens with various mean density was analyzed to correlate the mean free path and the density. For the first step, the relative specimen thickness (the ratio of the real thickness/the mean free path) was evaluated through EELS data and then the real thickness of the specimens was measured through transmission electron microscope observation. It was found that the mean free path in polyethylene depends on the specimen density and is about 500 nm at electron energy of 200 KeV with an electron beam radius of 10 nm

Keywords

carrier mean free path; electron energy loss spectra; electron mean free path; electron spectra; polyethylene insulation; transmission electron microscopy; 200 keV; FE-STEM; density; electron energy loss spectrum; electron mean free path; polyethylene insulation; transmission electron microscopy; Density measurement; Electrons; Energy loss; Energy measurement; Energy resolution; Image analysis; Optical microscopy; Plastic insulation; Polyethylene; Polymers;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on

Conference_Location

Seoul

Print_ISBN

0-7803-2651-2

Type

conf

DOI

10.1109/ICPADM.1997.617635

Filename

617635