DocumentCode
1648679
Title
Power and Thermal Challenges for 65 nm and Below
fYear
2006
Abstract
Summary form only for tutorial.
Keywords
CMOS technology; Circuits and systems; Electrothermal effects; Energy management; Power dissipation; Power system management; Power system modeling; Power system reliability; Thermal factors; Thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 2006. ICCAD '06. IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Print_ISBN
1-59593-389-1
Type
conf
DOI
10.1109/ICCAD.2006.320043
Filename
4110108
Link To Document