• DocumentCode
    1649176
  • Title

    Phase fitting method for sub-pixel displacement measurements using digital speckle images

  • Author

    Zheng, Mai ; Ji, Jian ; Guo, Li ; Zhu, Junzhu

  • Author_Institution
    Dept. of Electron. Sci. & Technol., Univ. of Sci. & Technol. of China, Hefei
  • fYear
    2008
  • Firstpage
    26
  • Lastpage
    29
  • Abstract
    This paper presents a technique to measure the minute displacement using digital speckle images. We firstly de-noise the speckle images using wavelet transform. And then the phase correlation algorithm is employed to calculate the integer pixel displacement. To get the sub-pixel accuracy, we make use of the pixels around the highest phase impulse to construct a continuous surface. The final displacement is obtained by computing the regional extreme point of the surface function. In this way, we boost up the phase correlation and get the sub-pixel information without the time-consuming template matching as used in DSCM (Digital Speckle Correlation Method). We demonstrated the feasibility and effectiveness of our method on practical measuring results.
  • Keywords
    displacement measurement; image denoising; speckle; wavelet transforms; digital speckle correlation method; digital speckle images; displacement measurement; image denoising; integer pixel displacement; minute displacement; phase correlation; phase fitting; sub-pixel information; surface function; template matching; wavelet transforms; Adaptive optics; Correlation; Displacement measurement; Noise reduction; Optical distortion; Optical polarization; Optical scattering; Optical surface waves; Speckle; Surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing, 2008. ICSP 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2178-7
  • Electronic_ISBN
    978-1-4244-2179-4
  • Type

    conf

  • DOI
    10.1109/ICOSP.2008.4697060
  • Filename
    4697060