DocumentCode
1649903
Title
Stability and yield-oriented ultra-low-power embedded 6T SRAM cell design optimization
Author
Makosiej, Adam ; Thomas, Olivier ; Vladimirescu, Andrei ; Amara, Amara
Author_Institution
Inst. Super. d´´Electron. de Paris, Paris, France
fYear
2012
Firstpage
93
Lastpage
98
Abstract
This paper presents a methodology for the optimal design of CMOS 6T SRAM ultra-low-power (ULP) bitcells minimizing power consumption under strict stability constraints in all operating modes. An accurate analytical SRAM subthreshold model is developed for characterizing the cell behavior and optimizing its performance. The proposed design approach is demonstrated for an SRAM implemented in a 32nm CMOS UTBB-FDSOI technology. Stable operation in both read and write is obtained for the optimized cell at VDD=0.4V. Moreover, in the optimization process the standby and active power were reduced up to 10x and 3x, respectively.
Keywords
CMOS memory circuits; SRAM chips; low-power electronics; power consumption; silicon-on-insulator; CMOS 6T SRAM ultra-low-power bitcells; CMOS UTBB-FDSOI technology; ULP bitcells; accurate analytical SRAM subthreshold model; active power; cell behavior; design approach; operating modes; optimal design; optimization process; optimized cell; power consumption; stable operation; standby power; strict stability constraints; yield-oriented ultra-low-power embedded 6T SRAM cell design optimization; Equations; MOS devices; Mathematical model; Random access memory; Stability analysis; Transistors; Wireless sensor networks;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4577-2145-8
Type
conf
DOI
10.1109/DATE.2012.6176439
Filename
6176439
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