DocumentCode
1650168
Title
Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem
Author
Ibrahim, Walid ; El-Chouemi, Amr ; El-Sayed, Hesham
fYear
2006
fDate
3/8/2006 12:00:00 AM
Firstpage
402
Lastpage
408
Keywords
Algorithm design and analysis; Controllability; Costs; Educational institutions; Genetic algorithms; Information technology; Microprocessors; System testing; System-on-a-chip; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Systems and Applications, 2006. IEEE International Conference on.
Print_ISBN
1-4244-0211-5
Type
conf
DOI
10.1109/AICCSA.2006.205122
Filename
1618387
Link To Document