• DocumentCode
    1650690
  • Title

    A New Statistical Max Operation for Propagating Skewness in Statistical Timing Analysis

  • Author

    Chopra, Kaviraj ; Zhai, Bo ; Blaauw, David ; Sylvester, Dennis

  • Author_Institution
    Dept. of Electron. Eng. & Comput. Sci., Michigan Univ.
  • fYear
    2006
  • Firstpage
    237
  • Lastpage
    243
  • Abstract
    Statistical static timing analysis (SSTA) is emerging as a solution for predicting the timing characteristics of digital circuits under process variability. For computing the statistical max of two arrival time probability distributions, existing analytical SSTA approaches use the results given by Clark (1961). These analytical results are exact when the two operand arrival time distributions have jointly Gaussian distributions. Due to the nonlinear max operation, arrival time distributions are typically skewed. Furthermore, nonlinear dependence of gate delays and non-Gaussian process parameters also make the arrival time distributions asymmetric. Therefore, for computing the max accurately, a new approach is required that accounts for the inherent skewness in arrival time distributions. In this work, we present analytical solution for computing the statistical max operation. First, the skewness in arrival time distribution is modeled by matching its first three moments to a so-called skewed normal distribution. Then by extending Clark´s work to handle skewed normal distributions we derive analytical expressions for computing the moments of the max. We then show using initial simulations results that using a skewness based max operation has a significant potential to improve the accuracy of the statistical max operation in SSTA while retaining its computational efficiency
  • Keywords
    digital circuits; statistical analysis; timing circuits; Gaussian distribution; digital circuit; probability distribution; statistical max operation; statistical timing analysis; Delay effects; Digital circuits; Distributed computing; Electric variables; Gaussian distribution; Integrated circuit interconnections; Permission; Probability distribution; Random variables; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2006. ICCAD '06. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    1-59593-389-1
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2006.320142
  • Filename
    4110180