• DocumentCode
    1650710
  • Title

    Evaluation on efficient measurement setup for transient-induced latchup with bi-polar trigger

  • Author

    Ker, Ming-Dou ; Hsu, Sheng-Fu

  • Author_Institution
    Nanoelectron. & Gigascale Syst. Lab., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2005
  • Firstpage
    121
  • Lastpage
    128
  • Keywords
    CMOS integrated circuits; integrated circuit measurement; integrated circuit reliability; thyristors; transient response; 0.25 micron; CMOS IC reliability; SCR; TLU immunity; current-blocking diode; current-limiting resistance; electrical over-stress damage; ring oscillator test circuit; transient-induced latchup measurement; underdamped bi-polar trigger; CMOS technology; Circuit testing; Current measurement; Diodes; Electrical resistance measurement; Electromagnetic interference; Electrostatic discharge; Ring oscillators; Thyristors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
  • Print_ISBN
    0-7803-8803-8
  • Type

    conf

  • DOI
    10.1109/RELPHY.2005.1493073
  • Filename
    1493073
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1650710