• DocumentCode
    1651548
  • Title

    Delay variation mapping induced by dynamic laser stimulation

  • Author

    Sanchez, Kevin ; Deplats, Romain ; Beaudoin, Felix ; Perdu, Philippe ; Lewis, Dean ; Vedagarbha, Praveen ; Woods, Gary

  • Author_Institution
    CREDENCE, CNES, Toulouse, France
  • fYear
    2005
  • Firstpage
    305
  • Lastpage
    311
  • Keywords
    CMOS integrated circuits; characteristics measurement; delays; failure analysis; integrated circuit measurement; laser beam applications; CMOS structure characterization; CMOS transistor characteristics; defective IC; delay variation mapping; dynamic laser stimulation; failure analysis; laser assisted device alteration; photoelectric laser stimulation; propagation delay measurement; soft defect localization; thermal laser stimulation; time margin alterations; Delay effects; Laboratories; Laser beams; Laser transitions; Power lasers; Propagation delay; Silicon; Thermal resistance; Vehicle dynamics; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
  • Print_ISBN
    0-7803-8803-8
  • Type

    conf

  • DOI
    10.1109/RELPHY.2005.1493103
  • Filename
    1493103
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1651548