• DocumentCode
    1653603
  • Title

    An ATPG driver selection algorithm for interconnect test with boundary scan

  • Author

    Her, Wei-Cheng ; Jin, Lin-Ming ; El-Ziq, Yacoub

  • fYear
    1995
  • Firstpage
    382
  • Keywords
    Automatic test pattern generation; Bridges; Driver circuits; Electronic equipment testing; Fault detection; Integrated circuit testing; Logic; Pins; Registers; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527847
  • Filename
    527847
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1653603