• DocumentCode
    1654608
  • Title

    Voltage propagation method for 3-D power grid analysis

  • Author

    Zhang, Cheng ; Pavlidis, Vasilis F. ; De Micheli, Giovanni

  • Author_Institution
    Integrated Syst. Lab., EPFL, Lausanne, Switzerland
  • fYear
    2012
  • Firstpage
    844
  • Lastpage
    847
  • Abstract
    Power grid analysis is a challenging problem for modern integrated circuits. For 3-D systems fabricated using stacked tiers with TSVs, traditional power grid analysis methods for planar (2-D) circuits do not demonstrate the same performance. An efficient IR drop analysis method for 3-D large-scale circuits, called 3-D voltage propagation method, is proposed in this paper. This method is compared with another widely used power grid analysis method, with preconditioned conjugated gradients. Simulation results demonstrate that the proposed method is more efficient for the IR drop analysis of large size 3-D power grids. Speedups between 10× to 20× over the preconditioned conjugated gradients method are shown.
  • Keywords
    three-dimensional integrated circuits; 2D circuits; 3D large-scale circuits; 3D power grid analysis method; 3D voltage propagation method; IR drop analysis; IR drop analysis method; planar circuits; preconditioned conjugated gradients; Algorithm design and analysis; Benchmark testing; Convergence; Integrated circuit modeling; Power grids; Resistance; Through-silicon vias; 3-D integrated circuits; Power grid analysis; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4577-2145-8
  • Type

    conf

  • DOI
    10.1109/DATE.2012.6176613
  • Filename
    6176613