DocumentCode
1654800
Title
Evaluation of structures in C18TCNQ Langmuir-Blodgett ultrathin films with and without adsorbed donors using attenuated total reflection method
Author
Kato, Keizo ; Ohashi, Kenichi ; Aoki, Yusuke ; Shinbo, Kazunari ; Kaneko, Futao ; Kobayashi, Satoshi
Author_Institution
Graduate Sch. of Sci. & Technol., Niigata Univ., Japan
Volume
1
fYear
1997
Firstpage
563
Abstract
The structures are investigated using attenuated total reflection (ATR) for octadecyl-7,7´,8,8´-tetracyano-quinodimethane (C18TCNQ) Langmuir-Blodgett (LB) ultrathin films with and without adsorbed electronic donors of p-phenylenediamine (PD) and N,N,N´,N´-tetramethyl-p-phenylenediamine (TMPD). The thickness of the LB films is determined by theoretical curve fitting to the ATR curves assuming the dielectric constant of the LB films. The obtained thickness of the LB films without adsorbed donors is much larger than the molecular length of C18TCNQ. This is thought to be caused by the formation of bimolecular layers in the LB films. In contrast, LB films with adsorbed donors have monomolecular layered structure
Keywords
Langmuir-Blodgett films; dielectric thin films; organic compounds; reflectivity; visible spectra; C18TCNQ; LB film thickness; Langmuir-Blodgett ultrathin films; N,N,N´,N´-tetramethyl-p-phenylenediamine; adsorbed donors; attenuated total reflection; bimolecular layers; curve fitting; dielectric constant; molecular length; monomolecular layered structure; octadecyl-7,7´,8,8´-tetracyano-quinodimethane; p-phenylenediamine; structure evaluation; visible absorption spectra; Chemical lasers; Conductive films; Dielectric constant; Glass; Laser beams; Optical films; Optical surface waves; Reflection; Substrates; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location
Seoul
Print_ISBN
0-7803-2651-2
Type
conf
DOI
10.1109/ICPADM.1997.617662
Filename
617662
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