DocumentCode
1655569
Title
Electron transport in the long-range charge-recombination dynamics of single encapsulated dye molecules on TiO2 nanoparticle films
Author
Yeow, Edwin K L ; Wu, Xiangyang
Author_Institution
Div. of Chem. & Biol. Chem., Nanyang Technol. Univ., Singapore, Singapore
fYear
2010
Firstpage
773
Lastpage
774
Abstract
The interfacial electron transfer and subsequent charge-recombination between single carbo-rhodamine Atto647N molecules and TiO2 nanoparticle and between single cucurbit[7]uril encapsulated Atto647N molecules and TiO2 nanoparticle are studied. Power-law distributions for the lifetimes of the dark charge-separated states are obtained. This is attributed to the broad time range taken for the injected electron to diffuse between traps on the TiO2 nanoparticle before undergoing back electron transfer (BET) to the oxidized dye. A significantly smaller power-law exponent for the inclusion complex suggests that the spatial separation, created by the macrocyclic host, between the dye molecule and metal oxide results in a slower BET rate and a longer electron transport process. Computational simulations based on the continuous-time random walk are used to model the electron transport process, and the power-law exponent values obtained from the computational simulations are consistent with the experimental observations.
Keywords
dark states; dyes; nanoparticles; semiconductor materials; semiconductor thin films; semiconductor-insulator boundaries; titanium compounds; back electron transfer; charge-recombination dynamics; computational simulations; continuous-time random walk; dark charge-separated states; inclusion complex; interfacial electron transfer; nanoparticle films; oxidized dye; power-law distributions; power-law exponent; single carbo-rhodamine Atto647N molecules; single cucurbit uril encapsulated Atto647N molecules; single encapsulated dye molecules; Absorption; Chemistry; Computational modeling; Current measurement; Decision support systems; Electron emission; Electron traps; Fluorescence; Kinetic theory; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-3543-2
Electronic_ISBN
978-1-4244-3544-9
Type
conf
DOI
10.1109/INEC.2010.5424467
Filename
5424467
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