• DocumentCode
    1656203
  • Title

    Revealing side-channel issues of complex circuits by enhanced leakage models

  • Author

    Heuser, Annelie ; Schindler, Werner ; Stöttinger, Marc

  • Author_Institution
    ISS - Integrated Circuit & Syst. Lab., Tech. Univ. Darmstadt, Darmstadt, Germany
  • fYear
    2012
  • Firstpage
    1179
  • Lastpage
    1184
  • Abstract
    In the light of implementation attacks a better understanding of complex circuits of security sensitive applications is an important issue. Appropriate evaluation tools and metrics are required to understand the origin of implementation flaws within the design process. The selected leakage model has significant influence on the reliability of evaluation results concerning the side-channel resistance of a cryptographic implementation. In this contribution we introduce methods, which determine the accuracy of the leakage characterization and allow to quantify the signal-to-noise ratio. This allows a quantitative assessment of the side-channel resistance of an implementation without launching an attack. We validate the conclusions drawn from our new methods by real attacks and obtain similar results. Compared to the commonly used Hamming Distance model in our experiments enhanced leakage models increased the attack efficiency by up to 500%.
  • Keywords
    combinational circuits; cryptography; leakage currents; logic design; complex circuits; cryptographic implementation; design process; enhanced leakage model; evaluation reliability; implementation flaws; leakage characterization; security sensitive applications; side-channel issues; side-channel resistance; signal-to-noise ratio; Approximation error; Integrated circuit modeling; Random variables; Signal to noise ratio; Stochastic processes; Vectors; approximation error; constructive side-channel analysis; secure hardware design; signal-to-noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4577-2145-8
  • Type

    conf

  • DOI
    10.1109/DATE.2012.6176672
  • Filename
    6176672