• DocumentCode
    1656805
  • Title

    3D-FlashMap: A physical-location-aware block mapping strategy for 3D NAND flash memory

  • Author

    Wang, Yi ; Bathen, Luis Angel D ; Shao, Zili ; Dutt, Nikil D.

  • Author_Institution
    Dept. of Comput., Hong Kong Polytech. Univ., Kowloon, China
  • fYear
    2012
  • Firstpage
    1307
  • Lastpage
    1312
  • Abstract
    Three-dimensional (3D) flash memory is emerging to fulfil the ever-increasing demands of storage capacity. In 3D NAND flash memory, multiple layers are stacked to increase bit density and reduce bit cost of flash memory. However, the physical architecture of 3D flash memory leads to a higher probability of disturbance to adjacent physical pages and greatly increases bit error rates. This paper presents 3D-FlashMap, a novel physical-location-aware block mapping strategy for three-dimensional NAND flash memory. 3D-FlashMap permutes the physical mapping of blocks and maximizes the distance between consecutively logical blocks, which can significantly reduce the disturbance to adjacent physical pages and effectively enhance the reliability. We apply 3D-FlashMap to a representative flash storage system. Experimental results show that the proposed scheme can reduce uncorrectable page errors by 85% with less than 2% space overhead in comparison with the baseline scheme.
  • Keywords
    circuit reliability; error statistics; flash memories; logic gates; 3D NAND flash memory; 3D-FlashMap; bit cost reduction; bit density; bit error rates; disturbance probability; flash storage system; logical blocks; physical-location-aware block mapping strategy; reliability; space overhead; storage capacity; three-dimensional NAND flash memory; Ash; Equations; File systems; Logic gates; Reliability; Resource management; Three dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4577-2145-8
  • Type

    conf

  • DOI
    10.1109/DATE.2012.6176694
  • Filename
    6176694