DocumentCode
1656805
Title
3D-FlashMap: A physical-location-aware block mapping strategy for 3D NAND flash memory
Author
Wang, Yi ; Bathen, Luis Angel D ; Shao, Zili ; Dutt, Nikil D.
Author_Institution
Dept. of Comput., Hong Kong Polytech. Univ., Kowloon, China
fYear
2012
Firstpage
1307
Lastpage
1312
Abstract
Three-dimensional (3D) flash memory is emerging to fulfil the ever-increasing demands of storage capacity. In 3D NAND flash memory, multiple layers are stacked to increase bit density and reduce bit cost of flash memory. However, the physical architecture of 3D flash memory leads to a higher probability of disturbance to adjacent physical pages and greatly increases bit error rates. This paper presents 3D-FlashMap, a novel physical-location-aware block mapping strategy for three-dimensional NAND flash memory. 3D-FlashMap permutes the physical mapping of blocks and maximizes the distance between consecutively logical blocks, which can significantly reduce the disturbance to adjacent physical pages and effectively enhance the reliability. We apply 3D-FlashMap to a representative flash storage system. Experimental results show that the proposed scheme can reduce uncorrectable page errors by 85% with less than 2% space overhead in comparison with the baseline scheme.
Keywords
circuit reliability; error statistics; flash memories; logic gates; 3D NAND flash memory; 3D-FlashMap; bit cost reduction; bit density; bit error rates; disturbance probability; flash storage system; logical blocks; physical-location-aware block mapping strategy; reliability; space overhead; storage capacity; three-dimensional NAND flash memory; Ash; Equations; File systems; Logic gates; Reliability; Resource management; Three dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4577-2145-8
Type
conf
DOI
10.1109/DATE.2012.6176694
Filename
6176694
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