• DocumentCode
    1656990
  • Title

    RMT “single-cluster” criterion for predicting large errors (outliers) in maximum-likelihood detection-estimation

  • Author

    Abramovich, Yuri I. ; Johnson, Bruce A. ; Spencer, Nicholas K.

  • Author_Institution
    Defence Sci. & Technol. Organ., Edinburgh, SA, Australia
  • fYear
    2009
  • Firstpage
    241
  • Lastpage
    244
  • Abstract
    We investigate the sudden onset of failure in maximum-likelihood (ML) detection-estimation on multivariate Gaussian models with a critically small number of data samples (observations). Using methods from random matrix theory (RMT) [also known as generalised statistical analysis (GSA) or G-analysis], we demonstrate that, for any set of true (exact) data parameters, we can identify a parametric space of covariance matrix models that are statistically as likely as the true one. The continuum of such equally likely models defines the nonidentifiability ldquoambiguity regionrdquo of the ML estimation (MLE). When this region includes models with completely erroneous parameters (ldquooutliersrdquo), MLE ldquoperformance breakdownrdquo is predicted.
  • Keywords
    Gaussian processes; covariance matrices; error detection; maximum likelihood detection; maximum likelihood estimation; ambiguity region; ambiguity region nonidentifiability; covariance matrix models; data samples; error prediction; failure sudden onset; generalised statistical analysis; maximum-likelihood detection-estimation; multivariate Gaussian models; parametric space; performance breakdown; random matrix theory; single cluster criterion; Australia; Covariance matrix; Electric breakdown; Maximum likelihood detection; Maximum likelihood estimation; Parameter estimation; Predictive models; Signal detection; Statistical analysis; Technological innovation; array signal processing; maximum likelihood estimation; parameter estimation; signal detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Statistical Signal Processing, 2009. SSP '09. IEEE/SP 15th Workshop on
  • Conference_Location
    Cardiff
  • Print_ISBN
    978-1-4244-2709-3
  • Electronic_ISBN
    978-1-4244-2711-6
  • Type

    conf

  • DOI
    10.1109/SSP.2009.5278593
  • Filename
    5278593