Delay Test: The Next Frontier for LSSD Test Systems

Delay testing, as opposed to static testing introduces the parameter of time as a new variable. Time impacts the way defects manifest themselves and are modeled as faults, as well as how defect sizes and system timing statistics interact with tester timing constraints in the detection of causes for dynamic system malfunctions. This paper briefly discusses some of the issues that had to be addressed in the development of a comprehensive system for delay testing in a Level Sensitive Scan Design environment.