• DocumentCode
    1665844
  • Title

    Terahertz profilometer by time-domain polarimetry

  • Author

    Yasumatsu, Naoya ; Watanabe, Shinichi

  • Author_Institution
    Dept. of Phys., Keio Univ., Yokohama, Japan
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We experimentally show that continuously changing polarity of an elliptically-polarized terahertz electric-field can be used to image a height profile of semiconductors, metals, and their hybrid samples with a depth resolution of ~1 μm.
  • Keywords
    ellipsometry; polarimetry; terahertz wave devices; terahertz wave imaging; depth resolution; elliptically-polarized terahertz electric-field; height of; hybrid samples; metals; semiconductors; terahertz profilometer; time-domain polarimetry; Image resolution; Imaging; Optical surface waves; Polarimetry; Surface topography; Surface waves; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2012 Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4673-1839-6
  • Type

    conf

  • Filename
    6326108
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1665844