• DocumentCode
    1665849
  • Title

    Simulation of thermal behavior for Networks-on-Chip

  • Author

    Wegner, Tim ; Cornelius, Claas ; Gag, Martin ; Tockhorn, Andreas ; Uhrmacher, Adelinde

  • Author_Institution
    Inst. of Appl. Microelectron. & Comput. Eng., Univ. of Rostock, Rostock, Germany
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Due to increasing integration densities and the emergence of nanotechnology, especially reliability and power related design aspects become critical for chip design. Since the arising problems are enforced by high circuit temperatures, the need for a possibility to model thermal behavior of a system in an accurate and physically correct way becomes inevitable. Hence, in this paper VulcaNoCs, a SystemC-based simulation environment for systems based on NoCs, is introduced. VulcaNoCs is designed to enable simultaneous execution of both high-level system simulation and dynamic modeling of temperature distributions in NoC-based systems. To emulate a system´s thermal properties equivalent RC-circuits are used, exploiting the dualism between heat flow and electrical phenomena. To verify the temperature model, VulcaNoCs is compared to a more commonly used SPICE-based approach, exhibiting significant increases in simulation performance of up to 98,5% for modeling a 2×2 NoC, for example.
  • Keywords
    equivalent circuits; integrated circuit design; integrated circuit modelling; network-on-chip; temperature distribution; SPICE; SystemC-based simulation environment; VulcaNoCs; chip design; dynamic modeling; equivalent RC-circuits; heat flow; high-level system simulation; integration density; networks-on-chip; temperature distribution; thermal behavior; Computational modeling; Integrated circuit modeling; Mathematical model; System-on-a-chip; Temperature measurement; Temperature sensors; Thermal resistance; Integrated Circuits; Network-on-Chip; Temperature Modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    NORCHIP, 2010
  • Conference_Location
    Tampere
  • Print_ISBN
    978-1-4244-8972-5
  • Electronic_ISBN
    978-1-4244-8971-8
  • Type

    conf

  • DOI
    10.1109/NORCHIP.2010.5669472
  • Filename
    5669472