DocumentCode
1665887
Title
Frequency stabilized laser source at around 2.09 μm by locking to H79Br and CO2 transitions
Author
Marano, M. ; Laporta, P. ; Svelto, C. ; Galzerano, G. ; Ottoboni, R.
Author_Institution
Dipt. di Fisica, Politecnico di Milano, Milan, Italy
Volume
1
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
737
Abstract
A tunable Tm-Ho:YAG laser was fabricated, characterized and used to perform high-resolution spectroscopy of several molecular absorption lines of HBr and CO2 at around 2090 nm. Frequency locking of this laser source to the H79Br P(12) transition at 2097.222 nm and to the CO2 P(22) transition at 2087.844 nm was then achieved using the fringe side locking technique. The frequency stability obtained was first evaluated by monitoring the error signal of the control loop, giving a root mean square (rms) value of ∼30 kHz for the residual frequency fluctuations with both molecular frequency references. A further stability analysis was performed by monitoring the beat note between two independently stabilized Tm-Ho:YAG lasers, giving a two-sample deviation of the beat frequency below 100 kHz for all integration times between 1 μs and 0.1 s.
Keywords
carbon compounds; frequency standards; holmium; hydrogen compounds; infrared spectra; laser frequency stability; laser tuning; microcavity lasers; rotational-vibrational states; solid lasers; thulium; 2.09 micron; CO2; HBr; YAG:Tm,Ho; YAl5O12:Tm,Ho; beat note; control loop error signal; eye-safe spectral region; frequency locking; frequency stability; frequency stabilized laser; frequency standards; fringe side locking technique; high-resolution spectroscopy; longitudinally pumped; molecular absorption lines; molecular frequency references; residual frequency fluctuations; rovibrational absorption line; transitions locking; tunable Tm,Ho:YAG microlaser; two-sample deviation; wavelength tuning; Absorption; Error correction; Fluctuations; Frequency; Laser stability; Laser transitions; Monitoring; Root mean square; Spectroscopy; Tunable circuits and devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
ISSN
1091-5281
Print_ISBN
0-7803-7218-2
Type
conf
DOI
10.1109/IMTC.2002.1006933
Filename
1006933
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