High-current emission from active-matrix HEED (high-efficiency electron emission device) - application to image sensing

Author

Negishi, Nobuaki ; Nakada, Takashi ; Sakemura, K. ; Okuda, Yukihiro ; Satoh, H. ; Watanabe, Atsuyori ; Yoshikawa, Tomoki ; Ogasawara, K. ; Namba, Masanori ; Okazaki, Shun ; Tanioka, K. ; Egami, N. ; Koshida, Nobuyoshi

Author_Institution

Corp. R & D Labs., Pioneer Corp., Saitama, Japan

fYear

2005

Firstpage

72

Lastpage

73

Abstract

A 256 × 192 pixels active-matrix cold electron emitter array with integrated scan driver circuits is developed. The basic structure of the electron emitter is almost the same as that of an advanced HEED (high-efficiency electron emission device) previously reported. The emission current density of the active-matrix HEED has been enhanced more than 100 times compared to that of the advanced HEED under the passive operation mode. It is demonstrated that the developed emitter can be applied to flat image sensing with a high-gain avalanche rushing amorphous photoconductor (HARP) target.

Keywords

field emitter arrays; 256 × 192 pixels active-matrix cold electron emitter array; HARP; active-matrix HEED; emission current density; flat image sensing; high-efficiency electron emission device; high-gain avalanche rushing amorphous photoconductor; integrated scan driver circuits; passive operation mode; Active matrix technology; Driver circuits; Electrodes; Electron emission; Electron guns; Image sensors; Integrated circuit technology; Pixel; Prototypes; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International

Print_ISBN

0-7803-8397-4

Type

conf

DOI

10.1109/IVNC.2005.1619490

Filename

1619490